Advertisement

XRF Plating Measurement Systems - Precisely Measure and Analyze Plating Thickness. Bowman XRF.

XRF Plating Measurement Systems - Precisely Measure and Analyze Plating Thickness. Bowman XRF. Bowman's P and M Series XRF instruments provide thickness measurement, elemental analysis, plating solution analysis. Quickly measure up to 5 coating layers simultaneously, including alloys and ultra-thin films. ASTM B-568.

Contact Bowman XRF here:

Learn more about Bowman XRF here:

coating thickness measurement,xrf,elemental analysis,x-ray fluorescense,instrument,unit,x-ray,

Post a Comment

0 Comments